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Paul Scherrer Institut
Paul Scherrer Institut
5232 Villigen PSI, Schweiz/Switzerland
Tel. +41 56 310 21 11
Fax. +41 56 310 21 99



Updated:
15.02.2006
E-Mail: maarten.nachtegaal@psi.ch + charlotte.heer@psi.ch


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Workshop on X-ray absorption spectroscopy and micro-spectroscopic techniques

When: February 20-21, 2006
  Where: Paul Scherrer Institute (West), Auditorium

 
Scope

The goal of the Workshop is to demonstrate and discuss the possibilities at the Swiss Light Source (Villigen, PSI) and the Swiss Norwegian Beamline (SNBL at ESRF, Grenoble) for structural studies at a molecular scale. The workshop will provide a stimulating forum to present new ideas, discuss future perspectives, and establish new collaborations.
 
Special emphasis will be placed on scientific applications of X-ray absorption spectroscopy (EXAFS and XANES), X-ray fluorescence (XRF), and novel microspectroscopic techniques suited for the investigation of highly heterogeneous (natural) materials. The workshop aims at bringing together experienced synchrotron users with potential future users with a background in geochemistry, catalysis, material science, solid state chemistry and biology. This workshop will be an ideal forum to learn about the enormous potential of (micro)XAS beamlines for molecular-scale research and to interact with world-leading Swiss scientists in synchrotron-based research. Currently, the SLS hosts two state-of-the-art beamlines dedicated to microfocused XAS, XRF, XRD (microXAS; LUCIA) for the study of both light and heavier elements (0.8–20 keV). A third XAS beamline (SuperXAS) is under construction for time-resolved studies and XRF tomography (5– 40 keV). Finally, the SNBL is especially suited for XAS experiments requiring high energies (5– 41keV), standard EXAFS/XANES experiments and the combination with other techniques such as XRD.
Location


5232 Villigen PSI

Switzerland

The Paul Scherrer Institut (PSI) is a national institute containing large research facilities and conducting basic research.

The most recently built facility is the Swiss Light Source (SLS), a third generation synchrotron providing intense x-ray beams for experimental stations utilizing both soft and hard x-rays.

Invited speakers:

U.Baltensperger PSI, Villigen Characterization of atmospheric aerosols with synchrotron radiation.
D. Bazin Univ. Paris XI, Orsay, France Bridging nanoscience and surface science to understand heterogeneous catalysis.
C. Bressler EPFL Lausanne Structural Dynamics of Chemical Systems Observed via Time-Resolved XAFS
M. Epple Univ. Essen, Germany The application of EXAFS in biomineralisation
F. Farges Univ. Marne de la Valeé, Paris, France From SNBL in 1995 to LUCIA in 2005 : 10 years of XAFS perspective
R. Frahm Univ. Wuppertal, Germany Quick EXAFS - Possibilities and Applications
E. Gallucci EPFL Lausanne Unresolved issues in cement chemistry - Can synchrotron methods help?
A. Johnson EAWAG Dübendorf Understanding processes in the aquatic and terrestrial environment; the potential of spectroscopic measurements
R. Kretzschmar ETH Zürich Speciation of trace metals in soils studied by synchrotron X-ray absorption spectroscopy
B. Ravel Argonne National Laboratory, USA A practical Introduction to Multiple Scattering Theory
T. Seward ETH Zürich X-ray absorption spectroscopic studies of aqueous electrolyte solutions at high temperatures and pressures.
L. Vincze Ghent University, Belgium Three-dimensional trace element microanalysis by scanning X-ray fluorescence tomography techniques
A. Weidenkaff EMPA, Dübendorf Characterisation of Functional Perovskite-type Materials

Venue

The workshop will combine invited talks with poster contributions.
A tour through the SLS will be organized, allowing participants take a close look at the experimental facilities and to discuss potential experiments.

Conference fee

The fee for the workshop, book of abstracts, coffee breaks and two lunches is CHF 100 for senior scientists and CHF 80 for students. Tickets for the worshop dinner in the 'Chuestall' can be bought for an additional CHF 60.

 

Contact

Sekretariat:
Charlotte Heer
charlotte.heer [at] psi.ch
Paul Scherrer Institut
Secr. XAS 2006
WSLA/123
5232 Villigen PSI
Switzerland